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Bayesian synthetic evaluation of multistage reliability growth with instant and delayed fix modes 被引量:5
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作者 Yan Zhiqiang Li Xinxin Xie Hongwei Jiang Yingjie 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2008年第6期1287-1294,共8页
In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within ... In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within a stage, by the proper selection of prior distribution form and the parameters, a concise posterior distribution form is obtained, thus simplifying the Bayesian analysis. In the multistage tests, the improvement factor is used to convert the posterior of one stage to the prior of the subsequent stage. The conversion criterion is carefully analyzed to determine the distribution parameters of the subsequent stage's variable reasonably. Based on the mentioned results, a new synthetic Bayesian evaluation program and algorithm framework is put forward to evaluate the multistage reliability growth tests with instant and delayed fix modes. The example shows the effectiveness and flexibility of this method. 展开更多
关键词 reliability growth Bayesian analysis improvement factor multistage test Weibull process
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