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Advancing multi-wavelength photoelasticity through single-exposure detection
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作者 Pengfei Zhu Suhas P.Veetil +5 位作者 Xiaoliang He Zhilong Jiang Yan Kong Aihui Sun Shouyu Wang Cheng Liu 《Chinese Optics Letters》 SCIE EI CAS CSCD 2024年第9期74-79,共6页
In this paper,we present a method to expedite multi-wavelength photoelasticity for efficient stress analysis.By modulating two slightly different-wavelength illumination beams and simultaneously capturing dark-field a... In this paper,we present a method to expedite multi-wavelength photoelasticity for efficient stress analysis.By modulating two slightly different-wavelength illumination beams and simultaneously capturing dark-field and bright-field images,our approach acquires four essential polarized images.Spatial filtering of Fourier transforms streamlines inner stress computation,enabling multi-wavelength photoelasticity with a single detector exposure.Theoretical foundations are outlined,and proof-of-principle experiments validate the feasibility with a measurement error below 6.4%.The high measurement speed,determined by the detector’s frame rate,facilitates dynamic sample measurements at video frequency,offering promising advancements in material stress analysis. 展开更多
关键词 PHOTOELASTICITY stress measurement structured illumination.
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