期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Application of nano-crystalline silicon film in the fabrication of field-emission pressure sensor
1
作者 廖波 陈旻 +2 位作者 孔德文 张大成 李婷 《Science China(Technological Sciences)》 SCIE EI CAS 2003年第4期418-422,共5页
A kind of filed-emission array pressure sensor is designed based on the quantum tunnel effect. The nano-crystalline silicon film is prepared by chemical vapor deposition (CVD) method, with the grain dimension and thic... A kind of filed-emission array pressure sensor is designed based on the quantum tunnel effect. The nano-crystalline silicon film is prepared by chemical vapor deposition (CVD) method, with the grain dimension and thickness of the film 3—9 nm and 30—40 nm, respectively. The nano-crystal- line silicon film is introduced into the cathode cones of the sensor, functioning as the essential emission part. The silicon nano phase is analyzed by HREM and TED, the microstructure of the single emitter and emitters array is inspected by SEM, and the field emission characteristics of the device are studied by an HP4145B transistor tester. The experimental results show that the measured current density emitted from the effective area of the sensor can reach 53.5 A/m2 when the exterior electric field is 5.6×105 V/m. 展开更多
关键词 NANO silicon film FIELD-EMISSION PRESSURE sensor FIELD-EMISSION characteristics.
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部