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Thermal Diffusivity of Film/Substrate Structures Characterized by Transient Thermal Grating Method 被引量:1
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作者 徐晓东 马頔 +2 位作者 张淑仪 罗爱华 KIYOTAKA Wasa 《Chinese Physics Letters》 SCIE CAS CSCD 2008年第1期176-179,共4页
Transient thermal grating method is used to measure the thermal diffusivity of absorbing films deposited on transparent substrates. According to periodically modulated dielectric constant variations and thermoelastic ... Transient thermal grating method is used to measure the thermal diffusivity of absorbing films deposited on transparent substrates. According to periodically modulated dielectric constant variations and thermoelastic deformations of the thin films caused by the transient thermal gratings, an improved optical diffraction theory is presented. In the experiment, the probing laser beam reflectively diffracted by the thermal grating is measured by a photomultiplier at different grating fringe spaces. The thermal diffusivity of the film can be evaluated by fitting the theoretical calculations of diffraction signals to the experimental measured data. The validity of the method is tested by measuring the thermal diffusivities of absorbing ZnO films deposited on glass substrates. 展开更多
关键词 ACOUSTIC-WAVES THIN-FILMS
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