The electrical performance of two-dimensional transition metal dichalcogenides （TMDs） is strongly affected by the number of structural defects. In this work, we provide an optical spectroscopic characterization appr...The electrical performance of two-dimensional transition metal dichalcogenides （TMDs） is strongly affected by the number of structural defects. In this work, we provide an optical spectroscopic characterization approach to correlate the number of structural defects and the electrical performance of WSe2 devices. Low-temperature photoluminescence （PL） spectra of electron-beam-lithography- processed WSe2 exhibit a clear defect-induced PL emission due to excitons bound to defects, which would strongly degrade the electrical performance. By adopting an electron-beam-free transfer-electrode technique, we successfully prepared a backgated WSe2 device containing a limited amount of defects. A maximum hole mobility of approximately 200 cm2.V -1.s-1 was achieved because of the reduced scattering sources, which is the highest reported value for this type of device. This work provides not only a versatile and nondestructive method to monitor the defects in TMDs but also a new route to approach the room-temperature phonon-limited mobility in high-performance TMD devices.展开更多
基金This work was supported by National Natural Science Foundation of China （Nos. 61422503, 21541013 and 61376104）, Natural Science Foundation of Jiangsu Province （No. BK20150596）, Jiangsu key laboratory for advanced metallic materials （No. BM2007204）, the open research funds of Key Laboratory of MEMS of Ministry of Education （SEU, China）, and the Funda- mental Research Funds for the Central Universities. The authors would like to thank Prof. Zhenhua Qiao from USTC, China for helpful discussions.
文摘The electrical performance of two-dimensional transition metal dichalcogenides （TMDs） is strongly affected by the number of structural defects. In this work, we provide an optical spectroscopic characterization approach to correlate the number of structural defects and the electrical performance of WSe2 devices. Low-temperature photoluminescence （PL） spectra of electron-beam-lithography- processed WSe2 exhibit a clear defect-induced PL emission due to excitons bound to defects, which would strongly degrade the electrical performance. By adopting an electron-beam-free transfer-electrode technique, we successfully prepared a backgated WSe2 device containing a limited amount of defects. A maximum hole mobility of approximately 200 cm2.V -1.s-1 was achieved because of the reduced scattering sources, which is the highest reported value for this type of device. This work provides not only a versatile and nondestructive method to monitor the defects in TMDs but also a new route to approach the room-temperature phonon-limited mobility in high-performance TMD devices.
