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Probe Contamination Effect in Silane Plasma and its Improvement
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作者 XI Zhonghe ZHANG Guanghua +2 位作者 YANG Fan XU Fang ZHANG Qiang 《Chinese Physics Letters》 SCIE CAS CSCD 1993年第2期100-102,共3页
The contamination behavior of Langmuir probe in silane glow discharge plasma are discussed.A hot electrical probe is suggested to improve the diagnostics of SiH_(4) plasma.Results show the safe duration for reliable m... The contamination behavior of Langmuir probe in silane glow discharge plasma are discussed.A hot electrical probe is suggested to improve the diagnostics of SiH_(4) plasma.Results show the safe duration for reliable measurements of electron temperature can be as long as 40min by this method. 展开更多
关键词 PROBE METHOD ELECTRICAL
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