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Multifractal Analysis of Morphology of TiO_2 Nano-films
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作者 ZhenFanSUN YuGuangLI 《Chinese Chemical Letters》 SCIE CAS CSCD 2003年第5期543-546,共4页
The SEM and AFM images of three TiO2 nano-films prepared at different conditions were obtained and transformed into digital format. The multifractal analyses for three films were made using height from a depth of thi... The SEM and AFM images of three TiO2 nano-films prepared at different conditions were obtained and transformed into digital format. The multifractal analyses for three films were made using height from a depth of thickness of film B and q from 55 to -55. The scale- invariance is very good for all lncq(e)~lne plots and t(q)~q plots at least close to three orders of magnitude. But the multifractal spectra f(a) of the films are quite distinct due to their different height distribution. 展开更多
关键词 TiO2 nano-films surface morphology multifractal spectra.
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