Polarization spectroscopy is used to lock a frequency-doubled Ti:Sapphire laser to the 425.5 nm ^(7)S3→^(7)P_(4)0 transition of ^(52)Cr.A Cr−He hollow cathode discharge cell is designed and fabricated to produce Cr a...Polarization spectroscopy is used to lock a frequency-doubled Ti:Sapphire laser to the 425.5 nm ^(7)S3→^(7)P_(4)0 transition of ^(52)Cr.A Cr−He hollow cathode discharge cell is designed and fabricated to produce Cr atom vapor instead of a high temperature cell.Without any modulation devices or lock-in amplifiers,a high signal-to-background level polarization spectroscopy signal is obtained.Moreover,a frequency fluctuation of±295 kHz for more than one hour is achieved.展开更多
A single-axis normal-tracking measurement system is proposed, which can solve the problem of measuring large curved surface. According to Collins formula, the tilt dependent error of the measurement system is studied,...A single-axis normal-tracking measurement system is proposed, which can solve the problem of measuring large curved surface. According to Collins formula, the tilt dependent error of the measurement system is studied, which uses Gaussian beam as the light source. By theoretical analysis and numerical simulation, the influence of the error is presented. The results show that there is the difference between point source and Gaussian beam for differential confocal microscopy. The opti-mal diameter of pinhole can be determined by the mathematical model and the actual parameters of the measurement system. The optimal pinhole diameter of this measurement system is 20 to 35 pm for 633 nm wavelength light source.展开更多
文摘Polarization spectroscopy is used to lock a frequency-doubled Ti:Sapphire laser to the 425.5 nm ^(7)S3→^(7)P_(4)0 transition of ^(52)Cr.A Cr−He hollow cathode discharge cell is designed and fabricated to produce Cr atom vapor instead of a high temperature cell.Without any modulation devices or lock-in amplifiers,a high signal-to-background level polarization spectroscopy signal is obtained.Moreover,a frequency fluctuation of±295 kHz for more than one hour is achieved.
基金Quantity Dissemination and Quality Safety Project of AQSIQ(No.ALC1501)National Key Scientific Instrument and Equipment Development Projects,China(No.2013YQ170539)
文摘A single-axis normal-tracking measurement system is proposed, which can solve the problem of measuring large curved surface. According to Collins formula, the tilt dependent error of the measurement system is studied, which uses Gaussian beam as the light source. By theoretical analysis and numerical simulation, the influence of the error is presented. The results show that there is the difference between point source and Gaussian beam for differential confocal microscopy. The opti-mal diameter of pinhole can be determined by the mathematical model and the actual parameters of the measurement system. The optimal pinhole diameter of this measurement system is 20 to 35 pm for 633 nm wavelength light source.
