期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
Critical Transient Processes of Enhancement-mode GaN HEMTs in High-efficiency and High-reliability Applications 被引量:2
1
作者 Lucas(Juncheng)Lu Guanliang Liu Kevin(Hua)Bai 《CES Transactions on Electrical Machines and Systems》 2017年第3期283-291,共9页
Wide-bandgap devices,such as silicon-carbide metal-oxide-semiconductor field-effect transistors(MOSFETs)and gallium-nitride high electron mobility transistors(HEMTs),exhibit an excellent figure of merits compared to c... Wide-bandgap devices,such as silicon-carbide metal-oxide-semiconductor field-effect transistors(MOSFETs)and gallium-nitride high electron mobility transistors(HEMTs),exhibit an excellent figure of merits compared to conventional silicon devices.Challenges of applying such fast switches include accurate extraction and optimization of parasitics especially when 6high-efficiency operation,all of which require the comprehensive understanding of such switch especially its interaction with peripheral circuits.Particularly for the enhancement-mode GaN HEMTs without the intrinsic body diode,when reverse conducting,its high voltage drop causes a high dead-time loss,which has rarely a concern in silicon devices.This paper focuses on 650V/30~60A enhancement-mode GaN HEMTs provided by GaN Systems,analytically models its switching behaviors,summarizes the impact of parasitics and dead time,and applies it in two DC/DC converters.Systematic design rules are generated not only for soft switching but also for hard switching applications. 展开更多
关键词 DC/DC converter dead time double pulse test GaN HEMT soft switching
下载PDF
Applying Normally-off GaN HEMTs for Coreless High-frequency Wireless Chargers 被引量:2
2
作者 Wei Qian Xi Zhang +2 位作者 Yongsheng Fu Juncheng Lu Hua Bai 《CES Transactions on Electrical Machines and Systems》 2017年第4期418-427,共10页
Wide-bandgap(WBG)devices such as Gallium-Nitride(GaN)High Electron Mobility Transistors(HEMTs)have become popular in the power electronics industry as they offer a lower switching loss,higher thermal capability and hi... Wide-bandgap(WBG)devices such as Gallium-Nitride(GaN)High Electron Mobility Transistors(HEMTs)have become popular in the power electronics industry as they offer a lower switching loss,higher thermal capability and higher power density than conventional silicon devices.As an attempt of applying WBG devices to the wireless charging technology,this paper adopts two different types of normally-off GaN HEMTs.One adopts the cascode structure provided by Transphorm Inc,operated under 800kHz to charge a battery pack on an electric scooter at 48 V/500W,with the air gap between the transceiver and receiver of~10cm.The other is enhancement-mode GaN HEMTs provided by GaN Systems Inc,operated at~6MHz to use one transceiver to charge multiple cell phones@~20W.Both of these chargers have no magnetic cores to reduce the cost and weight.Experimental results show both types of GaN HEMTs significantly increased the charging efficiency over conventional Si devices.Challenges of applying such fast-transition devices are discussed,e.g.,common-source inductance and the gate-drive-loop parasitic. 展开更多
关键词 COOLMOS GaN HEMT Wide-bandgap semiconductor wireless power transfer zero voltage switching.
下载PDF
氮化镓器件在大功率电力电子系统中的应用 被引量:4
3
作者 卢俊诚 陈迪 《电力电子技术》 CSCD 北大核心 2017年第9期1-2,共2页
氮化镓(GaN)器件由于其卓越的开关特性,被逐渐应用于10 kW及以上系统。器件并联技术能够进一步降低GaN器件的导通损耗,增加系统的功率容量,开始成为工业界关注的重点。由于其极快的开关速度,GaN器件并联的主要挑战在于对其功率回路及驱... 氮化镓(GaN)器件由于其卓越的开关特性,被逐渐应用于10 kW及以上系统。器件并联技术能够进一步降低GaN器件的导通损耗,增加系统的功率容量,开始成为工业界关注的重点。由于其极快的开关速度,GaN器件并联的主要挑战在于对其功率回路及驱动回路寄生参数的优化设计。探讨了并联器件特性及寄生参数对开关特性的影响,并详细给出了基于四管并联240 A/650V的半桥模块参考设计,双脉冲实验验证了半桥模块在额定电流下的开关特性。 展开更多
关键词 氮化镓器件 电力电子系统 大功率
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部