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Nickel and nickel-phosphorous matrix composite electrocoatings 被引量:5
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作者 Nicolas SPYRELLIS Evangelia A.PAVLATOU +1 位作者 Styliani SPANOU Alexandros ZOIKIS-KARATHANASIS 《中国有色金属学会会刊:英文版》 EI CSCD 2009年第4期800-804,共5页
Nickel and nickel-phosphorous matrix composite coatings reinforced by TiO2,SiC and WC particles were produced under direct and pulse current conditions from an additive-free Watts' type bath.The influence of the v... Nickel and nickel-phosphorous matrix composite coatings reinforced by TiO2,SiC and WC particles were produced under direct and pulse current conditions from an additive-free Watts' type bath.The influence of the variable electrolysis parameters(type of current,frequency of current pulses and current density) and the reinforcing particles properties(type,size and concentration in the bath) on the surface morphology and the structure of the deposits was examined.It is demonstrated that the embedding of ceramic particles modifies in various ways the nickel electrocrystallisation process.On the other hand,Ni-P amorphous matrix is not affected by the occlusion of the particles.Overall,the imposition of pulse current conditions leads to composite coatings with increased embedded percentage and more homogenous distribution of particles in the matrix than coatings produced under direct current regime. 展开更多
关键词 复合材料涂层 镍磷 脉冲电流 WC颗粒 二氧化钛 电解参数 颗粒特性 电流密度
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Characterization of Thin Films by Low Incidence X-Ray Diffraction 被引量:2
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作者 Mirtat Bouroushian Tatjana Kosanovic 《Crystal Structure Theory and Applications》 2012年第3期35-39,共5页
Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide... Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide, zinc selenide, cadmium selenide and combinations thereof) obtained by electrochemical growth, in order to determine the composition of ultra-thin surface layers, to estimate film thickness, and perform depth profiling of multilayered heterostructures. The experimental data are treated on the basis of a simple absorption-diffraction model involving the glancing angle of X-ray incidence. 展开更多
关键词 Glancing Angle X-Ray DIFFRACTION Thin films Titanium OXIDES Metal CHALCOGENIDES ELECTRODEPOSITION
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