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Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations 被引量:1
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作者 朱云龙 Julien Vaillant +3 位作者 Guillaume Montay Manuel Fran?ois Yassine Hadjar Aurélien Bruyant 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第7期40-44,共5页
Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. Ho... Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera. 展开更多
关键词 Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations
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