The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of st...The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of strong electromagnetic pulses(EMPs)generated during the interactions can severely hinder its employment.For this reason,the diagnostic system must be designed to have high EMP shielding.Here we present a new advanced prototype of detector,developed at ENEA-Centro Ricerche Frascati(Italy),with a large-area(15 mm×15 mm)polycrystalline diamond sensor having 150 μm thickness.The tailored detector design and testing ensure high sensitivity and,thanks to the fast temporal response,high-energy resolution of the reconstructed ion spectrum.The detector was offline calibrated and then successfully tested during an experimental campaign carried out at the PHELIX laser facility(E_(L)~100 J,τ_(L)=750 fs,I_(L)(1-2.5)×10^(19)W/cm^(2))at GSI(Germany).The high rejection to EMP fields was demonstrated and suitable calibrated spectra of the accelerated protons were obtained.展开更多
基金funding from the Euratom research and training program 2014-2018 and 2019-2020 under grant agreement No.633053funding from LASERLAB-EUROPE(grant agreement No.654148,European Union’s Horizon 2020 research and innovation program)supported by the Ministry of Science and Higher Education of the Russian Federation(Agreement with Joint Institute for High Temperatures RAS No.075-15-2020-785,dated 23 September 2020).
文摘The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of strong electromagnetic pulses(EMPs)generated during the interactions can severely hinder its employment.For this reason,the diagnostic system must be designed to have high EMP shielding.Here we present a new advanced prototype of detector,developed at ENEA-Centro Ricerche Frascati(Italy),with a large-area(15 mm×15 mm)polycrystalline diamond sensor having 150 μm thickness.The tailored detector design and testing ensure high sensitivity and,thanks to the fast temporal response,high-energy resolution of the reconstructed ion spectrum.The detector was offline calibrated and then successfully tested during an experimental campaign carried out at the PHELIX laser facility(E_(L)~100 J,τ_(L)=750 fs,I_(L)(1-2.5)×10^(19)W/cm^(2))at GSI(Germany).The high rejection to EMP fields was demonstrated and suitable calibrated spectra of the accelerated protons were obtained.
