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Solid-phase Crystallization of Amorphous Silicon Films by Rapid Thermal Annealing 被引量:5
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作者 JINRui-min LUJing-xiao LIRui WANGHai-yan FENGTuan-hui 《Semiconductor Photonics and Technology》 CAS 2005年第1期37-39,共3页
The morphous silicon films prepared by PECVD at substrate temperatures of 30℃ have been crystallized by rapid thermal annealing method, the budget of time-temperature in the annealing process is 600℃ for 120s,... The morphous silicon films prepared by PECVD at substrate temperatures of 30℃ have been crystallized by rapid thermal annealing method, the budget of time-temperature in the annealing process is 600℃ for 120s, 850℃ for 120s, and 950℃ for 120s. The results indicate the crystallization at 850℃ and 950℃ are better as shown in micro-Raman scattering and scanning electronic microscope. 展开更多
关键词 固相晶化 非晶硅 快速热退火 PECVD
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