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Electron spectroscopies and their use for materials characterization 被引量:1
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作者 Didier SEBILLEAU +1 位作者 Zi-Yu WU 《Nuclear Science and Techniques》 SCIE CAS CSCD 2003年第1期28-48,共21页
We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explain... We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explained in relation to the physical processes on which they are based. Furthermore, we explore critically and in detail various tools that have been developed to allow a systematic solving of structures by these spectroscopies. 展开更多
关键词 低能电子衍射 X射线吸收光谱 X射线衍射 电子光谱 材料 表征 表面分析 应用
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