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Waterproof coatings for high-power laser cavities
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作者 Xinbin Cheng Siyu Dong +4 位作者 Song Zhi Sebastian Paschel Istvan Balasa Detlev Ristau Zhanshan Wang 《Light(Science & Applications)》 SCIE EI CAS CSCD 2019年第1期1063-1068,共6页
With the ever-increasing laser power and repetition rate,thermal control of laser media is becoming increasingly important.Except for widely used air cooling or a bonded heat sink,water cooling of a laser medium is mo... With the ever-increasing laser power and repetition rate,thermal control of laser media is becoming increasingly important.Except for widely used air cooling or a bonded heat sink,water cooling of a laser medium is more effective in removing waste heat.However,how to protect deliquescent laser media from water erosion is a challenging issue.Here,novel waterproof coatings were proposed to shield Nd:Glass from water erosion.After clarifying the dependence of the waterproof property of single layers on their microstructures and pore characteristics,nanocomposites that dope SiO_(2) in HfO_(2) were synthesized using an ion-assisted co-evaporation process to solve the issue of a lack of a highindex material that simultaneously has a dense amorphous microstructure and wide bandgap.Hf_(0.7)Si_(0.3)O_(2)/SiO_(2) multifunctional coatings were finally shown to possess an excellent waterproof property,high laser-induced damage threshold(LIDT)and good spectral performance,which can be used as the enabling components for thermal control in high-power laser cavities. 展开更多
关键词 POWER HIGH PROPERTY
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Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
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作者 C.Trager-Cowan A.Alasmari +33 位作者 W.Avis J.Bruckbauer P.R.Edwards B.Hourahine S.Kraeusel G.Kusch R.Johnston G.Naresh-Kumar R.W.Martin M.Nouf-Allehiani E.Pascal L.Spasevski D.Thomson S.Vespucci P.J.Parbrook M.D.Smith J.Enslin F.Mehnke M.Kneissl C.Kuhn T.Wernicke S.Hagedorn A.Knauer V.Kueller S.Walde M.Weyers P.-M.Coulon P.A.Shields Y.Zhang L.Jiu Y.Gong R.M.Smith T.Wang A.Winkelmann 《Photonics Research》 SCIE EI CSCD 2019年第11期I0017-I0026,共10页
In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hypers... In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hyperspectral imaging. We present our recent results on the use of these non-destructive techniques to obtain information on the topography, crystal misorientation, defect distributions, composition, doping, and light emission from a range of UV-emitting nitride semiconductor structures. We aim to illustrate the developing capability of each of these techniques for understanding the properties of UV-emitting nitride semiconductors, and the benefits were appropriate, in combining the techniques. 展开更多
关键词 ELECTRON NITRIDE DOPING
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