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Advanced approaches to high precision MEMS metrology based on interferometric,confocal,and tactile techniques
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作者 Peter Lehmann 《Optoelectronics Letters》 EI 2008年第2期143-146,共4页
Geometrical features of micro-systems can be determined by either tactile or optical profiling techniques, which show different non-linear transfer characteristics. This has to be considered especially, if the instrum... Geometrical features of micro-systems can be determined by either tactile or optical profiling techniques, which show different non-linear transfer characteristics. This has to be considered especially, if the instruments operate close to their physical limitations. Depending on the specific measuring task either point-wise or areal optical measurement may be advantageous. Hence, examples for both approaches are discussed. Furthermore, systematic effects, which are related to the measuring principle have to be taken into account, e.g. if sharp edges or slopes are present on the measuring object. As it is shown, for white-light interferometry these difficulties can be solved by a two-wavelength technique. 展开更多
关键词 精密度 MEMS 计量方法 干涉测量 触摸技术
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