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Analysis of the dV/dt effect on an IGBT gate circuit in IPM
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作者 华庆 李泽宏 +2 位作者 张波 黄祥钧 程德凯 《Journal of Semiconductors》 EI CAS CSCD 2013年第4期64-68,共5页
The effect ofdV/dt on the IGBT gate circuit in IPM is analyzed both by simulation and experiment. It is shown that a voltage slope applied across the collector-emitter terminals of the IGBT can induce a gate voltage s... The effect ofdV/dt on the IGBT gate circuit in IPM is analyzed both by simulation and experiment. It is shown that a voltage slope applied across the collector-emitter terminals of the IGBT can induce a gate voltage spike through the feedback action of the parasitic capacitances of the IGBT. The dV/dt rate, gate-collector capacitance, gate-emitter capacitance and gate resistance have a direct influence on this voltage spike. The device with a higher dV/dt rate, gate-collector capacitance, gate resistance and lower gate-emitter capacitance is more prone to dV/dt induced self turn-on. By optimizing these parameters, the dV/dt induced voltage spike can be effectively controlled. 展开更多
关键词 IGBT dV/dt voltage spike IPM
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