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Anomalous scattering-induced circular dichroism in continuously shaped metasurface 被引量:1
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作者 Xuehai Tan 《光电工程》 CAS CSCD 北大核心 2017年第1期87-91,共5页
The interconnection of polarization and phase in electromagnetic scattering process has attracted both fundamental and practical interest.Here we propose the principle and experimental demonstration of a scatteringcon... The interconnection of polarization and phase in electromagnetic scattering process has attracted both fundamental and practical interest.Here we propose the principle and experimental demonstration of a scatteringcontrol mechanism based on the simultaneous control of polarization and phase via a continuously shaped planar metasurface.Under circularly polarized illumination,the scattering is redirected to off-specular direction,leading to significant reduction of the scattering cross section.Theoretical investigation shows that the underlying physical mechanism is the spin-dependent phase modulation in the anisotropic scattering process.Our approach would provide valuable guidance for the full control of electromagnetic wave for diverse applications. 展开更多
关键词 scattering engineering circular dichroism continuously shaped metasurface
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Dynamic Properties of Long Large Cross-section Underground Structures in Dynamic Seismic Analysis
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作者 Chen Canshou Qi Chengzhi +2 位作者 Yang Xiuren Chen Guoxing Chen Jianjie 《Earthquake Research in China》 2011年第3期330-339,共10页
Seismic safety of underground structures is one of the main concerns in underground space exploitation.As the first step for dynamic seismic response analysis,the free vibration of long large cross-section underground... Seismic safety of underground structures is one of the main concerns in underground space exploitation.As the first step for dynamic seismic response analysis,the free vibration of long large cross-section underground structures is studied in the present paper.The general free transverse vibration motion equation of long large cross-section underground structure is derived with the comprehensive consideration of internal and external damping,effects of shear,cross-sectional rotational inertia and axial force,and a two-parameter soil model.In this way,Timoshenko's beam theory is extended.Two limit cases of free transverse vibration of underground structures are discussed.Parameter study shows that in general wave propagation velocities in structures increase with soil elastic parameters.However the influence of Winkler's parameter k-is significant while the effect of the second soil elastic parameter g-P is insignificant.The free vibration frequency of underground structures increases with relative wave number and soil elastic parameters.Unlike the influence of soil elastic parameters on wave propagation velocities,the influence of soil elastic parameters k-and g-P on the vibration frequency of underground structures have the same order;therefore the influence of the second soil parameter g-P on the free vibration of underground structures should not be neglected in dynamic seismic analysis of underground 展开更多
关键词 地下结构 大断面 动态特性 地震分析 自由振动频率 土壤参数 弹性参数 地下空间开发
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Measurement of Mg Content in Zn1-xMgxO Films by Electron Probe Microanalysis
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作者 延凤平 简水生 +5 位作者 王琳 尾形健一 小池一步 佐佐诚彦 井上正崇 矢野满明 《Chinese Physics Letters》 SCIE CAS CSCD 2006年第2期313-315,共3页
Zn1-xMgxO films are grown on A-sapphire substrates by molecular beam epitaxy, and Mg content in the Zn1-xMgxO films is measured by electron probe microanalysis (EPMA) when the acceleration voltage, the emission curr... Zn1-xMgxO films are grown on A-sapphire substrates by molecular beam epitaxy, and Mg content in the Zn1-xMgxO films is measured by electron probe microanalysis (EPMA) when the acceleration voltage, the emission current, and the magnification are set to be 1 k V, 30 μA and 1000, respectively. The dead time is controlled within 17%-20% during the measurement with the receive angle of characteristic x-ray of 45°. The Mg content of the ZnMgO film is calculated by the low energy calibration and the ZAF calibration. By comparing the measurement result with the theoretical analysis and the EPMA result with the inductively coupled plasma (ICP), one can obtain that the measured value of Mg content of the samples is in good agreement with the theoretical analysis no matter whether the phase separation exists or not, and the correctness of ICP and EPMA is valid when Mg content in the samples is less than 0.5. 展开更多
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分子束外延法在Sapphire衬底上生长的Zn_(1-x)Mg_xO薄膜折射率及厚度的测试 被引量:5
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作者 延凤平 郑凯 +8 位作者 王琳 李一凡 龚桃荣 简水生 尾形健一 小池一步 佐佐诚彦 井上正崇 矢野满明 《物理学报》 SCIE EI CAS CSCD 北大核心 2007年第7期4127-4131,共5页
利用偏振光椭圆率测量仪对分子束外延(MBE)法在Sapphire衬底上生长的Zn1-xMgxO薄膜的薄膜折射率和厚度进行了测试.结合ICP法测得的薄膜中的Mg组成量,经数值拟合,导出表征薄膜厚度与薄膜生长条件、薄膜折射率与薄膜中的Mg组成量之间关系... 利用偏振光椭圆率测量仪对分子束外延(MBE)法在Sapphire衬底上生长的Zn1-xMgxO薄膜的薄膜折射率和厚度进行了测试.结合ICP法测得的薄膜中的Mg组成量,经数值拟合,导出表征薄膜厚度与薄膜生长条件、薄膜折射率与薄膜中的Mg组成量之间关系的曲线,为MBE法在Sapphire衬底上生长Zn1-xMgxO薄膜时控制薄膜厚度以及在制作Zn1-xMgxO薄膜的波导时控制薄膜的折射率提供了理论依据. 展开更多
关键词 ZNMGO薄膜 偏振光椭圆率测量仪 折射率 分子束外延(MBE)
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利用ICP法测定ZnMgO薄膜的Mg组分 被引量:1
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作者 延凤平 简水生 +4 位作者 尾形健一 小池一步 佐佐诚彦 井上正崇 矢野满明 《物理学报》 SCIE EI CAS CSCD 北大核心 2006年第6期3013-3017,共5页
利用电感耦合等离子体(ICP)装置对分子束外延(MBE)法在Sapphire衬底上生长的Zn1-xMgxO薄膜的Mg组分进行了测试.经理论分析,得到使用1次和2次检量式所确定的Zn1-xMgxO薄膜中的Mg组分的差异.将采用1次检量式的ICP测定与EPMA测定结果进行对... 利用电感耦合等离子体(ICP)装置对分子束外延(MBE)法在Sapphire衬底上生长的Zn1-xMgxO薄膜的Mg组分进行了测试.经理论分析,得到使用1次和2次检量式所确定的Zn1-xMgxO薄膜中的Mg组分的差异.将采用1次检量式的ICP测定与EPMA测定结果进行对照,表明当Mg组分x≤0·5时二者的测试结果相当一致,由此证明ICP测试结果的正确性. 展开更多
关键词 ZNMGO薄膜 Mg组分 分子束外延(MBE) 电感耦合等离子体(ICP)
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ZnMgO薄膜的等离子体辅助分子束外延生长及其Mg组分分析
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作者 延凤平 简水生 +4 位作者 尾形健一 小池一步 佐佐诚彦 井上正崇 矢野满明 《中国科学(E辑)》 CSCD 北大核心 2004年第3期261-267,共7页
利用电感耦合等离子体(ICP)及电子束探针微分析(EPMA)装置对等离子体辅助的分子束外延(MBE)法在蓝宝石衬底上生长的Zn_(1-x)Mg_xO薄膜的Mg组分进行了测试,经理论分析,导出适合于生长过程中Zn过剩和Zn不足两种情况下进行Mg组分分析的理... 利用电感耦合等离子体(ICP)及电子束探针微分析(EPMA)装置对等离子体辅助的分子束外延(MBE)法在蓝宝石衬底上生长的Zn_(1-x)Mg_xO薄膜的Mg组分进行了测试,经理论分析,导出适合于生长过程中Zn过剩和Zn不足两种情况下进行Mg组分分析的理论模型,进一步针对Zn过剩的生长条件,得出表示薄膜的Mg组分与薄膜生长过程中Mg坩埚温度之间关系的数学表达式,并通过实验测试验证了这一表达式的正确性。 展开更多
关键词 电感耦合等离子体 ZNMGO薄膜 分子束外延 Mg组分 半导体材料
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Transition Gibbs free energy level cross section and formulation of carrier SRH recombination rate 被引量:1
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作者 Ken K.Chin 《Journal of Semiconductors》 EI CAS CSCD 2013年第12期9-12,共4页
The transition among multiple charging states of a semiconductor's localized intrinsic/impurity defects is considered as phase transitions, and the concept of transition Gibbs free energy level (TGFEL) is proposed.... The transition among multiple charging states of a semiconductor's localized intrinsic/impurity defects is considered as phase transitions, and the concept of transition Gibbs free energy level (TGFEL) is proposed. Dependence of the cross section of TGFEL on its charge state is discussed. Introduction of TGFEL to replace acti- vation energy has fundamentally important consequences for semiconductor physics and devices. TGFEL involves entropy. What is to be included and not included in the entropy term consistently for all defect levels is an unre- solved open question, related to correct interpretation of various experimental data associated with various defect levels. This work is a first step towards resolving this question. 展开更多
关键词 transition Gibbs free energy level Shockley-Read-Hall single level defects
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Analysis of Mg content of Zn_(1-x)Mg_xO film grown on sapphire substrates by plasma-assisted molecular beam epitaxy
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作者 K.Ogata K.Koike +2 位作者 S.Sasa M.Inoue M.Yano 《Science China(Technological Sciences)》 SCIE EI CAS 2004年第2期166-172,共7页
The Mg content of Zn1-xMgxO film grown on A-sapphire substrates by plasma-assisted molecular beam epitaxy is measured by inductively coupled plasma (ICP) and electronic probe microanalysis (EPMA). A theoretical model ... The Mg content of Zn1-xMgxO film grown on A-sapphire substrates by plasma-assisted molecular beam epitaxy is measured by inductively coupled plasma (ICP) and electronic probe microanalysis (EPMA). A theoretical model for analyzing the difference in the Mg content between Zn-rich and Zn-deficient conditions in the growth process is established, and the mathematical relation between Mg content and the temperature of the Mg cell is formulated under Zn-rich condition. The formula derived is proven to be correct by experiments. 展开更多
关键词 ZNMGO film Mg content molecular BEAM EPITAXY (MBE).
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Planar-symmetry-breaking induced antisymmetric magnetoresistance in van der Waals ferromagnet Fe_(3)GeTe_(2)
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作者 Ping Liu Caixing Liu +14 位作者 Zhi Wang Meng Huang Guojing Hu Junxiang Xiang Chao Feng Chen Chen Zongwei Ma Xudong Cui Hualing Zeng Zhigao Sheng Yalin Lu Gen Yin Gong Chen Kai Liu Bin Xiang 《Nano Research》 SCIE EI CSCD 2022年第3期2531-2536,共6页
Recently discovered magnetic van der Waals(vdW)materials provide an ideal platform to explore low-dimensional magnetism and spin transport.Its vdW interaction nature opens up unprecedented opportunities to build verti... Recently discovered magnetic van der Waals(vdW)materials provide an ideal platform to explore low-dimensional magnetism and spin transport.Its vdW interaction nature opens up unprecedented opportunities to build vertically stacked heterostructures with novel properties and functionalities.By engineering the planar structure as an alternative degree of freedom,herein we demonstrate an antisymmetric magnetoresistance(MR)in a vdW Fe_(3)GeTe_(2)flake with a step terrace that breaks the planar symmetry.This antisymmetric MR originates from a sign change of the anomalous Hall effect and the continuity of the current transport near the boundary of magnetic domains at the step edge.A repeatable domain wall due to the unsynchronized magnetization switching is responsible for this sign change.Such interpretation is supported by the observation of field-dependent domain switching,and the step thickness,temperature,and magnetic field orientation dependent MR.This work opens up new opportunities to encode magnetic information by controlling the planar domain structures in vdW magnets. 展开更多
关键词 2D magnetism Fe_(3)GeTe_(2) planar structure engineering antisymmetric magnetoresistance
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Semiconductor steady state defect effective Fermi level and deep level transient spectroscopy depth profiling
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作者 Ken K.Chin Zimeng Cheng 《Journal of Semiconductors》 EI CAS CSCD 2016年第9期26-32,共7页
The widely used deep level transient spectroscopy(DLTS) theory and data analysis usually assume that the defect level distribution is uniform through the depth of the depletion region of the n–p junction. In this w... The widely used deep level transient spectroscopy(DLTS) theory and data analysis usually assume that the defect level distribution is uniform through the depth of the depletion region of the n–p junction. In this work we introduce the concept of effective Fermi level of the steady state of semiconductor, by using which deep level transient spectroscopy depth profiling(DLTSDP) is proposed. Based on the relationship of its transition free energy level(TFEL) and the effective Fermi level, the rules of detectivity of the defect levels are listed. Computer simulation of DLTSDP is presented and compared with experimental data. The experimental DLTS data are compared with what the DLTSDP selection rules predicted. The agreement is satisfactory. 展开更多
关键词 Fermi level deep level transient spectroscopy Schottky junction
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