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In situ non-destructive measurement of Josephson junction resistance using fritting contact technique
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作者 Lei Du Hao-Ran Tao +7 位作者 Liang-Liang Guo Hai-Feng Zhang Yong Chen Xin Tian Chi Zhang Zhi-Long Jia Peng Duan Guo-Ping Guo 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第11期57-61,共5页
Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we pr... Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ,non-destructive measurements of Josephson junction resistance.Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz.Moreover,the fritting contact technique does not significantly affect qubit coherence time or the integrity of the superconducting film,confirming its non-destructive nature.This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues,thus supporting the advancement and practical deployment of superconducting quantum computing. 展开更多
关键词 NON-DESTRUCTIVE fritting contact qubit frequency Josephson junction resistance
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