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基于便携式坐标测量机的大齿轮测量方法 被引量:11
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作者 林虎 Frank Hartig +1 位作者 Karin Kniel 石照耀 《光学精密工程》 EI CAS CSCD 北大核心 2013年第7期1763-1770,共8页
针对目前便携式坐标测量机测量大齿轮的采样策略和评定算法存在的不足,设计了两种特殊的辅助标尺-渐开线标尺及螺旋线标尺。利用设计的两种标尺在大齿轮齿面上对齿廓及螺旋线的测量点进行标注,开展了齿轮的在位重复性测量的实验研究。... 针对目前便携式坐标测量机测量大齿轮的采样策略和评定算法存在的不足,设计了两种特殊的辅助标尺-渐开线标尺及螺旋线标尺。利用设计的两种标尺在大齿轮齿面上对齿廓及螺旋线的测量点进行标注,开展了齿轮的在位重复性测量的实验研究。利用关节臂坐标测量机及激光跟踪仪测量系统在德国计量研究院研制的1m外径齿轮样板上开展了测量实验,采用INVOLUTE Pro对采样数据点进行评定,给出了测量结果及测量不确定度。测量实验表明,基于新的齿轮测量方法,关节臂坐标测量机比激光跟踪仪测量系统测量结果更为精确,测试结果与标定值最大相差8.16μm。实验结果验证了提出方法的有效性,为便携式坐标测量机在大齿轮测量领域的应用提供了依据。 展开更多
关键词 大齿轮测量 便携式坐标测量机 大齿轮样板
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计量软件溯源中的TraCIM软件认证系统 被引量:4
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作者 汤洁 Frank Hrtig 石照耀 《工具技术》 北大核心 2017年第12期118-121,共4页
工业计量领域、校准实验室和计量研究机构均需要一致的计算溯源框架以对计量软件进行溯源。计量软件溯源主要是对其算法进行溯源,并与其特定的计算目标相关联。德国国家计量院(PTB)推出了国际计量软件认证系统(TraCIM)实施计量软件溯源... 工业计量领域、校准实验室和计量研究机构均需要一致的计算溯源框架以对计量软件进行溯源。计量软件溯源主要是对其算法进行溯源,并与其特定的计算目标相关联。德国国家计量院(PTB)推出了国际计量软件认证系统(TraCIM)实施计量软件溯源,国际软件认证包括高斯(Gauss)软件认证、切比雪夫(Chebyshev)软件认证和比对(Comparison)软件认证。TraCIM计量软件认证通过在专用网络平台上实施"认证用户—服务器"间的应用来实现。认证流程主要包括索要标准输入数据、提交结果和获得认证报告。计量领域企业三丰(Mitutoyo)、蔡司(Zeiss)均实施并通过认证。 展开更多
关键词 软件认证 TraCIM 软件溯源 国际比对 标准数据
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Uncertainty Calculation of Roundness Assessment by Automatic Differentiation in Coordinate Metrology
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作者 林家春 Michael Krystek 石照耀 《Journal of Measurement Science and Instrumentation》 CAS 2010年第3期224-227,共4页
Reomtly, Coordinate bieasuring Machines (CMMs) are widely used to measure roundness errors. Roundness is calculated from a large number of points collected from the profiles of the parts. According to the Guide to t... Reomtly, Coordinate bieasuring Machines (CMMs) are widely used to measure roundness errors. Roundness is calculated from a large number of points collected from the profiles of the parts. According to the Guide to the Expression of Uncertainty in Measta- meat (GUM), all measurement results must have a stated uncertainty associated the titan. However, no CMMs give the uncertainty value of the roundness, because no suitable measrement uncertainty calculation procedure exists. In the case of roundness raeasurement in coordinate metrology, this paper suggests the algorithms for the calculation of the measurement uncertainty of the roudness deviation based on the two mainly used association criteria, LSC and MZC. The calculation of the sensitivity coefficients for the uncertainty calculatiion can be done by autnatic differentiation, in order to avoid introducing additional emars by the traditional difference quotient approxima- tions. The proposed methods are exact and need input data only as the nrasured coordinates of the data points and their associated un- certainties. 展开更多
关键词 raeasurement uncertainty ROUNDNESS automatic diferentiation
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Towards Quantitative Characterisation of the Small Force Transducer Used in Nanoindentation Instruments
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作者 Zhi Li Uwe Brand 《Modern Instrumentation》 2013年第4期61-67,共7页
Quantitative characterization of the mechanical properties of materials in micro-/nano-scale using depth-sensing indentation technique demands high performance of nanoindentation instruments in use. In this paper, the... Quantitative characterization of the mechanical properties of materials in micro-/nano-scale using depth-sensing indentation technique demands high performance of nanoindentation instruments in use. In this paper, the efforts to calibrate the capacitive force transducer of a commercial nanoindentation instrument are presented, where the quasi-static characteristic of the force transducer has been calibrated by a precise compensation balance with a resolution of ~1 nN. To investigate the dynamic response of the transducer, an electrostatic MEMS (Micro-Electro-Mechanical System) based on nano-force transfer standard with nano-Newton (10-9 Newton) resolution and a bandwidth up to 6 kHz have been employed. Preliminary experimental results indicate that 1) the force transducer under calibration has a probing force uncertainty less than 300 nN (1σ) in the calibration range of 1 mN;2) the transient duration at contact points amounts to 10 seconds;3) the overshoot of engagement is pre-load dependent. 展开更多
关键词 NANOMETROLOGY NANOINDENTATION Instrument Nano-Force TRANSDUCER Microelectromechanical Systems Nano-Force Calibration
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Stabilization of Silica Gel against Hydrolysis by Doping with F^(-) or Zr(Ⅳ)
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作者 Khaled S.Abou-El-Sherbini Peter G.Weidler +4 位作者 Detlef Schiel Mohey H.A.Amr Henning Niemann Shady El-Dafrawy Wolfgang H.Holl 《Green and Sustainable Chemistry》 2014年第1期24-32,共9页
Silica gel (SG) was synthesized via acidification of sodium silicate solution then doped with Fˉ or Zr(IV) in molar ratios of F/Si 3/100, and Zr/Si 0.75/100 and 3.75/100 and sintered at 500°C, 800°C and 100... Silica gel (SG) was synthesized via acidification of sodium silicate solution then doped with Fˉ or Zr(IV) in molar ratios of F/Si 3/100, and Zr/Si 0.75/100 and 3.75/100 and sintered at 500°C, 800°C and 1000°C. The samples were investigated by X-ray diffractometry, infrared absorption and Raman spectra, surface area measurement, and inductively coupled plasma-optical emission spectrometry-monitored silica hydrolysis. All samples are mesoporous with BET surface areas 181.5 - 523.9 m2·gˉ1. The surface area of the silica samples decreases as the sintering temperature increases. The hydrolysis process of silica decreases as the sintering temperature increases and as the surface area decreases. The pH and the type of buffer solution affect the hydrolysis of silica samples due to a SN2 reaction mechanism favored in basic media using ammonia buffer. Zr(IV) increases the stability of silica samples against the hydrolysis as confirmed by the structural investigation, surface area and silica hydrolysis. Fˉ observably decreases the silica hydrolysis process when presenting on the surface of SG. 展开更多
关键词 Silica Gel DOPING HYDROLYSIS FLUORINE ZIRCONIUM
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High-rate intercity quantum key distribution with a semiconductor single-photon source
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作者 Jingzhong Yang Zenghui Jiang +13 位作者 Frederik Benthin Joscha Hanel Tom Fandrich Raphael Joos Stephanie Bauer Sascha Kolatschek Ali Hreibie Eddy Patrick Rugeramigabo Michael Jetter Simone Luca Portalupi Michael Zopf Peter Michler tefan Kuck Fei Ding 《Light(Science & Applications)》 SCIE EI CSCD 2024年第10期2114-2123,共10页
Quantum key distribution(QKD)enables the transmission of information that is secure against general attacks by eavesdroppers.The use of on-demand quantum light sources in QKD protocols is expected to help improve secu... Quantum key distribution(QKD)enables the transmission of information that is secure against general attacks by eavesdroppers.The use of on-demand quantum light sources in QKD protocols is expected to help improve security and maximum tolerable loss.Semiconductor quantum dots(QDs)are a promising building block for quantum communication applications because of the deterministic emission of single photons with high brightness and low multiphoton contribution.Here we report on the first intercity QKD experiment using a bright deterministic single photon source.A BB84 protocol based on polarisation encoding is realised using the high-rate single photons in the telecommunication C-band emitted from a semiconductor QD embedded in a circular Bragg grating structure.Utilising the 79 km long link with 25.49 dB loss(equivalent to 130 km for the direct-connected optical fibre)between the German cities of Hannover and Braunschweig,a record-high secret key bits per pulse of 4.8 x io-5 with an average quantum bit error ratio of~0.65%are demonstrated.An asymptotic maximum tolerable loss of 28.11 dB is found,corresponding to a length of 144 km of standard telecommunication fibre.Deterministic semiconductor sources therefore challenge state-of-the-art QKD protocols and have the potential to excel in measurement device independent protocols and quantum repeater applications. 展开更多
关键词 structure. QUANTUM distribution
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Dimensional characterization of cadmium selenide nanocrystals via indirect Fourier transform evaluation of small-angle X-ray scattering data
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作者 Julian Cedric Porsiel Bilal Temel +2 位作者 Alfred Schirmacher Egbert Buhr Georg Garnweitner 《Nano Research》 SCIE EI CAS CSCD 2019年第11期2849-2857,共9页
The correlation of single-particle imaging and absorption spectroscopy made the development of sizing curves possible and enabled rapid size determination of semiconductor nanocrystals based solely on optical properti... The correlation of single-particle imaging and absorption spectroscopy made the development of sizing curves possible and enabled rapid size determination of semiconductor nanocrystals based solely on optical properties.The increasing demand and production of such materials has resulted in a question of comparability between existing models and adequate volume-weighted size-determining measurement techniques.Small-angle X-ray scattering(SAXS)is a well-established method for obtaining nanostructural information from particle systems while operating sample quantities up to a commercial scale with a large amount of statistically based data.This work utilizes laboratory SAXS to characterize cadmium selenide nanocrystals with band edge energies between 1.97 and 3.08 eV.The evaluation of the scattering patterns is based on an indirect Fourier transformation(IFT),while dimensional parameters are derived from the model-free pair distance distribution functions(Dmode and Dg),as well as the modeled volume(Dv)and number(Dn)-weighted size-density distributions.We find that comparable data from D̅n agree well with existing X-ray diffraction(XRD)and with transmission electron microscopy(TEM)results described in literature;this qualifies SAXS as an equivalent integral characterization method.Although based on an estimate,the radius of gyration yields equivalent accurate results.Additionally,corresponding volume-weighted data are shown that can be useful when transferring information to other techniques.Dmode parametrization represents the largest estimated size of the sample and implies that particles interact and deviate from the spherical morphology,whereas Dv demonstrates results not considering such effects.A full set of the parameters discussed quantifies the quality of a sample. 展开更多
关键词 quantum dots small angle scattering indirect Fourier transform transmission electron microscopy optical absorption spectroscopy particle size distribution
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Influence of slant of objective on image formation in optical microscopes
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作者 Rainer Kning 《Chinese Optics Letters》 SCIE EI CAS CSCD 2008年第8期603-606,共4页
A microscope image formation model based on scalar diffraction and Fourier optics has been developed, which takes a slant angle between the optical axis and the observed surface into account. The theoretical investiga... A microscope image formation model based on scalar diffraction and Fourier optics has been developed, which takes a slant angle between the optical axis and the observed surface into account. The theoretical investigations of the imaging of line structures using this model show that reflection type microscopes are much stronger influenced by the slant angle than transmission type microscopes. In addition, the slant angle changes the image contrast and the image shape of a line structure, especially its edge. The larger the slant angle, the stronger the decrease of the image contrast, and the less steep the edge slope in both types of microscopes. Furthermore, the larger the numerical aperture of the objective, the less the effect of the slant angle on the line image shape. 展开更多
关键词 LINE this
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