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Deep learning accelerates whole slide imaging for next-generation digital pathology applications
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作者 Yair Rivenson Aydogan Ozcan 《Light(Science & Applications)》 SCIE EI CAS CSCD 2022年第11期2558-2560,共3页
Deep learning demonstrates the ability to significantly increase the scanning speed of whole slide imaging in histology.This transformative solution can be used to further accelerate the adoption of digital pathology.
关键词 DEEP learning SLIDE
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