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Laser-based defect characterization and removal process for manufacturing fused silica optic with high ultraviolet laser damage threshold
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作者 Xiaocong Peng Xin Cheng +7 位作者 Chaoyang Wei Songlin Wan Kaizao Ni Zhenqi Niu Yichi Han Zhigang Jiang Zhen Cao Jianda Shao 《Light(Advanced Manufacturing)》 2023年第3期181-194,共14页
Residual processing defects during the contact processing processes greatly reduce the anti-ultraviolet(UV)laser damage performance of fused silica optics,which significantly limited development of high-energy laser s... Residual processing defects during the contact processing processes greatly reduce the anti-ultraviolet(UV)laser damage performance of fused silica optics,which significantly limited development of high-energy laser systems.In this study,we demonstrate the manufacturing of fused silica optics with a high damage threshold using a CO_(2)laser process chain.Based on theoretical and experimental studies,the proposed uniform layer-by-layer laser ablation technique can be used to characterize the subsurface mechanical damage in three-dimensional full aperture.Longitudinal ablation resolutions ranging from nanometers to micrometers can be realized;the minimum longitudinal resolution is<5 nm.This technique can also be used as a crack-free grinding tool to completely remove subsurface mechanical damage,and as a cleaning tool to effectively clean surface/subsurface contamination.Through effective control of defects in the entire chain,the laser-induced damage thresholds of samples fabricated by the CO_(2)laser process chain were 41%(0%probability)and 65.7%(100%probability)higher than those of samples fabricated using the conventional process chain.This laser-based defect characterization and removal process provides a new tool to guide optimization of the conventional finishing process and represents a new direction for fabrication of highly damage-resistant fused silica optics for high-energy laser applications. 展开更多
关键词 Fused silica Laser materials processing Defect characterization Subsurface damage Process chain
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High-sensitivity modulation of electromagnetically induced transparency analog in a THz asymmetric metasurface integrating perovskite and graphene
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作者 TONGLING WANG TENGTENG LI +6 位作者 HAIYUN YAO YUYING LU XIN YAN MAOYONG CAO LANJU LIANG MAOSHENG YANG JIANQUAN YAO 《Photonics Research》 SCIE EI CAS CSCD 2022年第10期2317-2327,共11页
Active control of the electromagnetically induced transparency(EIT)analog is desirable in photonics development.Here,we theoretically and experimentally proposed a novel terahertz(THz)asymmetric metasurface structure ... Active control of the electromagnetically induced transparency(EIT)analog is desirable in photonics development.Here,we theoretically and experimentally proposed a novel terahertz(THz)asymmetric metasurface structure that can possess high-sensitivity modulation under extremely low power density by integrating perovskite or graphene.Using the novel metasurface structure with the perovskite coating,the maximum amplitude modulation depth(AMD)of this perovskite-based device reached 490.53%at a low power density of 12.8037 mW/cm^(2).In addition,after the novel THz metasurface structure was combined with graphene,this graphene-based device also achieved high AMD with the maximum AMD being 180.56%at 16.312 mW/cm^(2),and its transmission amplitude could be electrically driven at a low bias voltage.The physical origin of this modulation was explained using a two-oscillator EIT model.This work provides a promising platform for developing high-sensitivity THz sensors,light modulators,and switches. 展开更多
关键词 PEROVSKITE integrating TRANSPARENCY
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Physics-based virtual coherence scanning interferometer for surface measurement 被引量:2
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作者 Rong Su Richard Leach 《Light(Advanced Manufacturing)》 2021年第2期24-39,共16页
Virtual instruments provide task-specific uncertainty evaluation in surface and dimensional metrology.We demonstrate the first virtual coherence scanning interferometer that can accurately predict the results from mea... Virtual instruments provide task-specific uncertainty evaluation in surface and dimensional metrology.We demonstrate the first virtual coherence scanning interferometer that can accurately predict the results from measurements of surfaces with complex topography using a specific real instrument.The virtual instrument is powered by physical models derived from first principles,including surface-scattering models,three-dimensional imaging theory,and error-generation models.By incorporating the influences of various error sources directly into the interferogram before reconstructing the surface,the virtual instrument works in the same manner as a real instrument.To enhance the fidelity of the virtual measurement,the experimentally determined three-dimensional transfer function of a specific instrument configuration is used to characterise the virtual instrument.Finally,we demonstrate the experimental validation of the virtual instrument,followed by virtual measurements and error predictions for several typical surfaces that are within the validity regime of the physical models. 展开更多
关键词 ERROR validity instrument
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