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Study on Integrated Thermal Cycle and Vibration Profile for HALT
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作者 陶俊勇 褚卫华 陈循 《Defence Technology(防务技术)》 SCIE EI CAS 2009年第2期81-87,共7页
Focusing on electronic products,this paper establishes a finite element model for printed circuit board(PCB)assembling with enhanced ball grid array(EBGA)component under vibration environment.Based on this model,it st... Focusing on electronic products,this paper establishes a finite element model for printed circuit board(PCB)assembling with enhanced ball grid array(EBGA)component under vibration environment.Based on this model,it studies relations between fatigue rate of solder joint and temperature,vibration frequency.Moreover,it analyzes propagation of micro-crack produced by thermal cycle under vibration stress.The results offer a method to optimize the thermal cycle and vibration integrated profile and to combine vibration test and thermal cycling for highly accelerated life test(HALT). 展开更多
关键词 振动环境 环和 高加速寿命试验 有限元模型 印刷电路板 电子产品 球栅阵列 振动频率
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