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Detection of subsurface defects of fused silica optics by confocal scattering microscopy 被引量:8
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作者 马彬 沈正祥 +5 位作者 贺鹏飞 季一勤 桑田 刘华松 刘丹丹 王占山 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第3期296-299,共4页
A non-destructive technique for subsurface measurements is proposed by combining light scattering method with laser confocal scanning tomography. The depth and distribution of subsurface defect layers are represented ... A non-destructive technique for subsurface measurements is proposed by combining light scattering method with laser confocal scanning tomography. The depth and distribution of subsurface defect layers are represented in term of scattered light intensity pattern, and three types of fused silica specimens are fabricated by different grinding and polishing processes to verify the validity and effectiveness. By using the direct measurement method with such technique, micron-scale cracks and scratches can be easily distinguished, and the instructional subsurface defect depths of 55, 15, and 4 μm are given in real time allowing for an in-process observation and detection. 展开更多
关键词 Crack detection Defects Grinding (machining) Light Light scattering SCATTERING Silica TOMOGRAPHY
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