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A GaN/InGaN/AlGaN MQW RTD for versatile MVL applications with improved logic stability 被引量:1
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作者 Haipeng Zhang Qiang Zhang +6 位作者 Mi Lin Weifeng Lü Zhonghai Zhang Jianling Bai Jian He Bin Wang Dejun Wang 《Journal of Semiconductors》 EI CAS CSCD 2018年第7期77-87,共11页
To improve the logic stability of conventional multi-valued logic(MVL) circuits designed with a GaNbased resonate tunneling diode(RTD), we proposed a GaN/InGaN/AlGaN multi-quantum well(MQW) RTD. The proposed RTD... To improve the logic stability of conventional multi-valued logic(MVL) circuits designed with a GaNbased resonate tunneling diode(RTD), we proposed a GaN/InGaN/AlGaN multi-quantum well(MQW) RTD. The proposed RTD was simulated through solving the coupled Schrodinger and Poisson equations in the numerical non-equilibrium Green's function(NEGF) method on the TCAD platform. The proposed RTD was grown layer by layer in epitaxial technologies. Simulated results indicate that its current-voltage characteristic appears to have a wider total negative differential resistance region than those of conventional ones and an obvious hysteresis loop at room temperature. To increase the Al composite of AIGaN barrier layers properly results in increasing of both the total negative differential resistance region width and the hysteresis loop width, which is helpful to improve the logic stability of MVL circuits. Moreover, the complement resonate tunneling transistor pair consisted of the proposed RTDs or the proposed RTD and enhanced mode HEMT controlled RTD8 is capable of generating versatile MVL modes at different supply voltages less than 3.3 V, which is very attractive for implementing more complex MVL function digital integrated circuits and systems with less devices, super high speed linear or nonlinear ADC and voltage sensors with a built-in super high speed ADC function. 展开更多
关键词 GaN/InGaN/AlGaN MQW RTD total NDR region width hysteresis characteristic MVL
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