期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Novel high- with low specific on-resistance high voltage lateral double-diffused MOSFET 被引量:1
1
作者 Li-Juan Wu Zhong-Jie Zhang +3 位作者 Yue Song Hang Yang Li-Min Hu Na Yuan 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第2期382-386,共5页
A novel voltage-withstand substrate with high-K(HK, k 〉 3.9, k is the relative permittivity) dielectric and low specific on-resistance(Ron,sp) bulk-silicon, high-voltage LDMOS(HKLR LDMOS)is proposed in this pap... A novel voltage-withstand substrate with high-K(HK, k 〉 3.9, k is the relative permittivity) dielectric and low specific on-resistance(Ron,sp) bulk-silicon, high-voltage LDMOS(HKLR LDMOS)is proposed in this paper. The high-K dielectric and highly doped interface N+-layer are made in bulk silicon to reduce the surface field drift region. The high-K dielectric can fully assist in depleting the drift region to increase the drift doping concentration(Nd) and reshape the electric field distribution. The highly doped N+-layer under the high-K dielectric acts as a low resistance path to reduce the Ron,sp. The new device with the high breakdown voltage(BV), the low Ron,sp, and the excellent figure of merit(FOM = BV^2/Ron,sp) is obtained. The BV of HKLR LDMOS is 534 V, Ron,sp is 70.6 m?·cm^2, and FOM is 4.039 MW·cm^(-2). 展开更多
关键词 LDMOS high-K dielectric highly doped N+-layer high voltage specific on-resistance
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部