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Conceptual design of the three-dimensional magnetic field configuration relevant to the magnetopause reconnection in the SPERF 被引量:2
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作者 毛傲华 任洋 +5 位作者 吉瀚涛 鄂鹏 韩轲 王志斌 肖青梅 李立毅 《Plasma Science and Technology》 SCIE EI CAS CSCD 2017年第3期27-33,共7页
A new ground-based expenmental device,the Space Plasma Environment Research Facility(SPERF),is being designed at Harbin Institute of Technology in China,with Asymmetric REconnection eXperiment-3 Dimensional(AREX-3D... A new ground-based expenmental device,the Space Plasma Environment Research Facility(SPERF),is being designed at Harbin Institute of Technology in China,with Asymmetric REconnection eXperiment-3 Dimensional(AREX-3D) as one of the experimental components to study the asymmetric reconnection dynamics relevant to the interaction between the interplanetary and magnetospheric plasmas.The asymmetry in the designed magnetic reconnection process not only refers to the distinct plasma parameters designed for the two upstream regions across the current sheet,but also refers to the inhomogeneity in the direction along the current sheet resulting from the designed 3D magnetic field geometry.These two asymmetries are fundamental features of the reconnection process at the Earth's magnetopause.In experiment,the reconnection process is driven by a set of flux cores through coil-currentramp-up from the 'magnetosheath-side' to interact with a dipole magnetic field generated by the Dipole Research Experiment(DREX) coil on the 'magnetosphere-side'.The AREX-3D will be able to investigate a range of important reconnection issues in 3D magnetic field geometry that is relevant to the Earth's magnetopause.A wide range of plasma parameters can be achieved through inductive plasma generation with flux cores on the 'magnetosheath-side' and electron cyclotron resonance(ECR) with microwave sources on the 'magnetosphere-side',e.g.high(low)plasma density at experimental magnetosheath(dipole) side.Different reconnection regimes and geometries can be produced by adjusting plasma parameters and coil setups as well as coil current waveforms.The three-dimensional magnetic field configurations in the SPERF relevant to the dayside magnetopause reconnection are discussed in detail. 展开更多
关键词 AREX-3D SPERF MAGNETOSPHERE reconnection experiment asymmetric magneticreconnection
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Feature matching based on geometric constraints in weakly calibrated stereo views of curved scenes 被引量:1
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作者 Bian Houqin Su Jianbo 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2008年第3期562-570,共9页
The identification of the correspondences of points of views is an important task. A new feature matching algorithm for weakly calibrated stereo images of curved scenes is proposed, based on mere geometric constraints... The identification of the correspondences of points of views is an important task. A new feature matching algorithm for weakly calibrated stereo images of curved scenes is proposed, based on mere geometric constraints. After initial correspondences are built via the epipolar constraint, many point-to-point image mappings called homographies are set up to predict the matching position for feature points. To refine the predictions and reject false correspondences, four schemes are proposed. Extensive experiments on simulated data as well as on real images of scenes of variant depths show that the proposed method is effective and robust. 展开更多
关键词 feature correspondence epipolar geometry fundamental matrix homography.
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A continuous analytic channel potential solution to doped symmetric double-gate MOSFETs from the accumulation to the strong-inversion region 被引量:1
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作者 何进 刘峰 +2 位作者 周幸叶 张健 张立宁 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第1期501-506,共6页
A continuous yet analytic channel potential solution is proposed for doped symmetric double-gate (DG) MOSFETs from the accumulation to the strong-inversion region. Analytical channel potential relationship is derive... A continuous yet analytic channel potential solution is proposed for doped symmetric double-gate (DG) MOSFETs from the accumulation to the strong-inversion region. Analytical channel potential relationship is derived from the complete 1-D Poisson equation physically, and the channel potential solution of the DG MOSFET is obtained analytically. The extensive comparisons between the presented solution and the numerical simulation illustrate that the solution is not only accurate and continuous in the whole operation regime of DG MOSFETs, but also valid to wide doping concentration and various geometrical sizes, without employing any fitting parameter. 展开更多
关键词 MOSFETS TRANSISTORS doping modeling double-gate (DG)
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One-dimensional continuous analytic potential solution to generic oxide-silicon-oxide system
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作者 张健 何进 张立宁 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第6期493-496,共4页
A one-dimensional continuous analytic potential solution to a generic oxide-silicon^xide system is developed. With the analytic solution, the potential distribution in the silicon film is predicted. A physics-based re... A one-dimensional continuous analytic potential solution to a generic oxide-silicon^xide system is developed. With the analytic solution, the potential distribution in the silicon film is predicted. A physics-based relation between surface potentials is also derived and then applied to the generic oxide-silicon-oxide metal oxide-semiconductor field-effect transistors (MOSFETs) for the calculation of surface potentials 展开更多
关键词 surface potential MOSFET modeling oxide-silicon-oxide system
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Clear correspondence between gated-diode R-G current and performance degradation of SOI n-MOSFETs after F-N stress tests
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作者 何进 马晨月 +4 位作者 王昊 陈旭 张晨飞 林信南 张兴 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第12期30-32,共3页
A clear correspondence between the gated-diode generation-recombination (R-G) current and the performance degradation of an SOI n-channel MOS transistor after F-N stress tests has been demonstrated. Due to the incre... A clear correspondence between the gated-diode generation-recombination (R-G) current and the performance degradation of an SOI n-channel MOS transistor after F-N stress tests has been demonstrated. Due to the increase of interface traps after F-N stress tests, the R-G current of the gated-diode in the SOI-MOSFET architecture increases while the performance characteristics of the MOSFET transistor such as the saturation drain current and sub-threshold slope are degraded. From a series of experimental measurements of the gated-diode and SOI-MOSFET DC characteristics, a linear decrease of the drain saturation current and increase of the threshold voltage as well as a like-line rise of the sub-threshold swing and a corresponding degradation in the trans-conductance are also observed. These results provide theoretical and experimental evidence for us to use the gated-diode tool to monitor SOI-MOSFET degradation. 展开更多
关键词 MOSFET degradation F-N stress interface traps gated-diode method SOI technology
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Diode parameter extraction by a linear cofactor difference operation method
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作者 马晨月 张辰飞 +3 位作者 王昊 何进 林信南 Mansun Chan 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第11期43-46,共4页
The linear cofactor difference operator(LCDO) method,a direct parameter extraction method for general diodes,is presented.With the developed LCDO method,the extreme spectral characteristic of the diode voltage-curre... The linear cofactor difference operator(LCDO) method,a direct parameter extraction method for general diodes,is presented.With the developed LCDO method,the extreme spectral characteristic of the diode voltage-current curves is revealed,and its extreme positions are related to the diode characteristic parameters directly.The method is applied to diodes with different sizes and temperatures,and the related characteristic parameters,such as reverse saturation current,series resistance and non-ideality factor,are extracted directly.The extraction result shows good agreement with the experimental data. 展开更多
关键词 LCDO DIODE parameter extraction ideality factor series resistance
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Forward gated-diode method for parameter extraction of MOSFETs
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作者 张辰飞 马晨月 +5 位作者 郭昕婕 张秀芳 何进 王国增 杨张 刘志伟 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第2期23-27,共5页
The forward gated-diode method is used to extract the dielectric oxide thickness and body doping concentration of MOSFETs, especially when both of the variables are unknown previously. First, the dielectric oxide thic... The forward gated-diode method is used to extract the dielectric oxide thickness and body doping concentration of MOSFETs, especially when both of the variables are unknown previously. First, the dielectric oxide thickness and the body doping concentration as a function of forward gated-diode peak recombination-generation (R-G) current are derived from the device physics. Then the peak R-G current characteristics of the MOSFETs with different dielectric oxide thicknesses and body doping concentrations are simulated with ISE-Dessis for parameter extraction. The results from the simulation data demonstrate excellent agreement with those extracted from the forward gated-diode method. 展开更多
关键词 forward gated-diode method recombination-generation current parameter extraction MOSFETS
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Application of WebGIS & Knowledge Based on Forest Pests Forecasting
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作者 Sun Xiaoying 《Chinese Forestry Science and Technology》 2012年第3期62-62,共1页
To improve the accuracy and effectiveness of forest pests forecasting,based on current forecast model,integrating the database and WebGIS technology,a practical design and construction approach of forest pest knowledg... To improve the accuracy and effectiveness of forest pests forecasting,based on current forecast model,integrating the database and WebGIS technology,a practical design and construction approach of forest pest knowledge base was put forward,and the forecast system on Web application framework was realized with satisfactory empirical results. 展开更多
关键词 WEBGIS KNOWLEDGE BASE FOREST PESTS forecasting
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A semi-empirical analytic model for threshold voltage instability in MOSFETs with high-k gate stacks
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作者 何进 马晨月 +2 位作者 张立宁 张健 张兴 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第8期63-66,共4页
A semi-empirical analytic model for the threshold voltage instability of a MOSFET is derived from Shockley-Read-Hall (SRH) statistics to account for the transient charging effects in a MOSFET high-k gate stack. Star... A semi-empirical analytic model for the threshold voltage instability of a MOSFET is derived from Shockley-Read-Hall (SRH) statistics to account for the transient charging effects in a MOSFET high-k gate stack. Starting from the single energy level and single trap assumption, an analytical expression for the filled trap density in terms of dynamic time is derived from SRH statistics. The semi-empirical analytic model for the threshold voltage instability is developed based on MOSFET device physics between the threshold voltage and the induced trap density. The obtained model is also verified by extensive experimental data of trapping and de-trapping stress from different high-k gate configurations. 展开更多
关键词 high-k gate stack nanoscale MOSFETs interface trap and charges trapping and detrapping threshold voltage dynamic behavior compact modeling
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