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IDENTIFICATION OF MARINE AEROSOL COMPONENT BY COMBINED NAA AND SCANNING ELECTRON MICROSCOPY WITH X—RAY ANALYSIS
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作者 杨绍晋 章一鸣 《Nuclear Science and Techniques》 SCIE CAS CSCD 1992年第3期205-209,共5页
The concentrations of 30 elements in aerosol particles collected in western Pacific ocean have been determined by INAA. The crustal element concentrations decrease with increasing distance from land over the remote ar... The concentrations of 30 elements in aerosol particles collected in western Pacific ocean have been determined by INAA. The crustal element concentrations decrease with increasing distance from land over the remote area close to Asia land and fluctuate around its average value over the remote ocean area. The volatile elements exhibite average atmospheric concentrations that are higher than those expected from the flux of seasalt or the continental dust. In order to identify marine aerosol component originating from the continent or ocean, the aerosol particles are examined by scanning electron microscopy combined with energy dispersive X-ray spectroscopy. Particle phase structure shows that the crustal aerosol particles are not present internal mixtures with seasalt aerosol, and it also proves the long-range transport of crustal elements from continent to ocean. 展开更多
关键词 AEROSOL SCANNING electron microscopy INAA EDS
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DESIGN AND PERFORMANCE OF SHAPING DEFLECTORS FOR VARIABLY SHAPED ELECTRON BEAM LITHOGRAPHY
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作者 康念坎 江钧基 +2 位作者 吴伟 黄兰友 吴明均 《Journal of Electronics(China)》 1990年第4期336-346,共11页
In order to obtain uniform exposure in variably shaped electron beam lithography,the beam current density and edge resolution on the target must not change for different spotshapes and sizes.The key to the goal is the... In order to obtain uniform exposure in variably shaped electron beam lithography,the beam current density and edge resolution on the target must not change for different spotshapes and sizes.The key to the goal is the appropriate design of shaping deflectors.A linearand rotation compensation approach is presented.Values of linear and rotation compensationfactors versus the distances between electron source image and centers of deflectors are measuredon an experimental electron beam column with variable spot shaping.The experimental resultsare in good agreement with the calculated ones. 展开更多
关键词 ELECTRON beam LITHOGRAPHY ELECTRON Optics SHAPING DEFLECTOR
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A Ne 633nm LASER WITH AN UNSTABLE CAVITY
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作者 陈天杰 于满喜 +2 位作者 黄显玲 覃绍京 游江南 《Chinese Physics Letters》 SCIE CAS CSCD 1989年第11期495-498,共4页
The way to find the eigenfield of a negative unstable cavity filled with a radial variable and self-adjustable gain medium is suggested.The calculated results based on this method fit the experimental data of the Ne 6... The way to find the eigenfield of a negative unstable cavity filled with a radial variable and self-adjustable gain medium is suggested.The calculated results based on this method fit the experimental data of the Ne 633nm laser satisfactorily. 展开更多
关键词 LASER TABLE UNSTABLE
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THE INTENSITYCHARACTERISTICS OF DIATOMIC IONINSECONDARY ION MASS SPECTROMETRY
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作者 汪国良 林卓然 《Chinese Science Bulletin》 SCIE EI CAS 1984年第11期1469-1474,共6页
Ⅰ. INTRODUCTION In recent years, ion microprobe secondary ion mass spectrometry has found a wide application in micro-analyses.However, isotopic and molecular ion mass interferences have posed a problem in qualitativ... Ⅰ. INTRODUCTION In recent years, ion microprobe secondary ion mass spectrometry has found a wide application in micro-analyses.However, isotopic and molecular ion mass interferences have posed a problem in qualitative or quantitative interpretation of 展开更多
关键词 SIMS ISOTOPIC interpretation qualitative posed ISOTOPES Probability mostly DERIVATION OVERLAPPING
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ION MICROPROBE ANALYSIS OF NONCONDUCTOR BY NEGATIVE ION BOMBARDMENT
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作者 林卓然 ION MICROPROBE GROUP 《Chinese Science Bulletin》 SCIE EI CAS 1981年第5期453-457,共5页
Ⅰ. INTRODUCTION In the application of ion microprobe mass analysis to various scientific fields such as material science, geology chemical engineering, biology and medicine, involving nonconductors, the analysis of n... Ⅰ. INTRODUCTION In the application of ion microprobe mass analysis to various scientific fields such as material science, geology chemical engineering, biology and medicine, involving nonconductors, the analysis of nonconductor is one of the most important problems. 展开更多
关键词 GEOLOGY HOLDER SPRAYING ADHESIVE putting instrument somewhat fairly diamond simplified
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