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Sinusoidal phase-modulating laser diode interferometer for real-time surface profile measurement 被引量:2
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作者 何国田 王向朝 +1 位作者 曾爱军 唐锋 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第3期164-167,共4页
A sinusoidal phase-modulating (SPM) laser diode (LD) interferometer for real-time surface profile measurement is proposed and its principle is analyzed. The phase signal of the surface profile is detected from the... A sinusoidal phase-modulating (SPM) laser diode (LD) interferometer for real-time surface profile measurement is proposed and its principle is analyzed. The phase signal of the surface profile is detected from the sinusoidal phase-modulating interference signal using a real-time phase detection circuit. For 60 × 60 measurement points of the surface profile, the measuring time is 10 ms. A root mean square (RMS) measurement repeatability of 3.93 nm is realized, and the measurement resolution reaches 0.19 nm. 展开更多
关键词 INTERFEROMETERS Phase modulation Real time systems Semiconductor lasers Signal detection
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Real-time displacement measurement with large range and high accuracy using sinusoidal phase modulating laser diode interferometer 被引量:2
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作者 何国田 王向朝 +2 位作者 曾爱军 唐锋 黄炳杰 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第4期211-214,共4页
To resolve the conflict of large measurement range and high accuracy in the existing real-time displacement measurement laser diode (LD) interferometers, a novel real-time displacement measurement LD interferometry ... To resolve the conflict of large measurement range and high accuracy in the existing real-time displacement measurement laser diode (LD) interferometers, a novel real-time displacement measurement LD interferometry is proposed and its measurement principle is analyzed. By use of a new phase demodulation algorithm and a new phase compensation algorithm of real-time phase unwrapping, the measurement accuracy is improved, and the measurement range is enlarged to a few wavelengths. In experiments, the peak-to-peak amplitude of the speaker vibration was 2361.7 nm, and the repeatability was 2.56 nm. The measurement time was less than 26 us. 展开更多
关键词 ALGORITHMS INTERFEROMETERS Semiconductor lasers
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