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An insulated gate bipolar transistor with surface n-type barrier
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作者 蒋梦轩 沈征 +4 位作者 王俊 帅智康 尹新 孙冰冰 廖淋圆 《Journal of Semiconductors》 EI CAS CSCD 2015年第12期91-96,共6页
This letter proposes a novel IGBT structure with an n-type barrier (NB-IGBT) formed on the silicon surface to enhance the conductivity modulation effect with a relatively simple fabrication process. TCAD simulation ... This letter proposes a novel IGBT structure with an n-type barrier (NB-IGBT) formed on the silicon surface to enhance the conductivity modulation effect with a relatively simple fabrication process. TCAD simulation indicates that the NB-IGBT offers a current density 49% higher and turn-off losses 25% lower than a conventional field-stop IGBT (FS-IGBT) with a similar breakdown voltage, turn-off time and avalanche energy. Furthermore, the NB-IGBT exhibits extremely large transconductance, which is favorable to turn-on and turn-off. Therefore, the proposed IGBT offers an attractive option for high-voltage and large-power electronics applications. 展开更多
关键词 breakdown voltage conductivity modulation current density latch up 1GBT
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