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The surface morphologies of (Pb,Sr)TiO_3 thin film fabricated on Si-buffered Pt/Ti/SiO_2/Si substrate
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作者 李弢 古宏伟 《广东有色金属学报》 2005年第2期310-313,共4页
(Pb,Sr)TiO3 (PST) thin film are fabricated by RF magnetron sputtering on Si-buffered Pt/Ti/SiO2/Si substrates with different buffer layer deposition time. Surface morphologies of the buffer layer indicate an improvi... (Pb,Sr)TiO3 (PST) thin film are fabricated by RF magnetron sputtering on Si-buffered Pt/Ti/SiO2/Si substrates with different buffer layer deposition time. Surface morphologies of the buffer layer indicate an improving surface roughness and larger grains with the prolongation of sputtering time. Deposition of PST thin films shows excellent surface fluctuation filling ability to improve the surface roughness of substrates. PST surface morphologies exhibit apparently different grain forms according to the preparation time durance of buffer layer. 展开更多
关键词 薄膜 微电子装置 溶胶-凝胶法
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