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Transcription-coupled repair pathway in UVC-induced SupF gene mutation in Tet-on 293 cell line
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作者 Li Jin Song Bo +4 位作者 Chen Zhiwen Zeng Yijun Zhou Huchuan Wei Quanfang Yang Jin 《Journal of Medical Colleges of PLA(China)》 CAS 2008年第2期76-80,共5页
Objective: To explore the role of transcription-coupled repair (TCR) pathway in the UVC-induced SupF gene mutation in Tet-on 293 cell line, we designed and constructed a Tet-responsive plasmid DNA pTCR-C1, and util... Objective: To explore the role of transcription-coupled repair (TCR) pathway in the UVC-induced SupF gene mutation in Tet-on 293 cell line, we designed and constructed a Tet-responsive plasmid DNA pTCR-C1, and utilized this pTCR-C 1 plasmid to obtain the mutation frequency of SupF reporter gene induced by UVC in Tet-on 293 cell line. Methods: SupF gene was cloned into a Tet-responsive plamid pBI-L, which include a bidirectional Tet-responsive promoter, and was named pTCR-C1. The pTCR-C1 plasmid was transfected into Tet-on 293 cell line, and the mutation frequency of SupF reporter gene was detected in the presence and absence of DOX. Results: The pTCR-C1 plasmid was identified with the methods of restriction digestion and DNA sequencing. The mutation frequency of SupF reporter gene in the presence of DOX was higher than in the absence of DOX. Conclusion: The TCR pathway takes part in the UVC-induced SupF gene mutation in Tet-on 293 cell line. 展开更多
关键词 Transcription-coupled repair SupF gene TET-ON Mutation frequency
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