Y_2O_3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91,115,162,196 and 215 K...Y_2O_3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91,115,162,196 and 215 K. Activation energies and characteristics of traps responsible for observed curves were revealed under the light of results of initial rise analyses and T_(max)-T_(stop) experimental methods. Analyses of TL curves obtained at different stopping temperatures resulted in presence of one quasi-continuously distributed trap with activation energies increasing from 18 to 24 meV and six single trapping centers at49, 117, 315, 409, 651 and 740 meV. Activation energies of all revealed centers were reported in the present paper. Structural characterization of Y_2O_3 nanoparticles was accomplished using X-ray diffraction and scanning electron microscopy measurements.展开更多
基金supported by the Middle East Technical University(METU),Project No:GAP-105-2018-2752
文摘Y_2O_3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91,115,162,196 and 215 K. Activation energies and characteristics of traps responsible for observed curves were revealed under the light of results of initial rise analyses and T_(max)-T_(stop) experimental methods. Analyses of TL curves obtained at different stopping temperatures resulted in presence of one quasi-continuously distributed trap with activation energies increasing from 18 to 24 meV and six single trapping centers at49, 117, 315, 409, 651 and 740 meV. Activation energies of all revealed centers were reported in the present paper. Structural characterization of Y_2O_3 nanoparticles was accomplished using X-ray diffraction and scanning electron microscopy measurements.